1999/2000 Monthly Chapter Meeting Notices

 

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SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby. [ MAP ]

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1999/2000 Monthly Chapter Meeting Notices
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1995/1996 Monthly Chapter Meeting Notices

September 2000 Meeting Notice

When/Where:
Tuesday, September 12, 2000.  Meeting info To Be Announced.
Topic/Speaker:
Annual Social and Business Planning Session
Details:
             The Santa Clara Valley EMC Society Chapter invites all EMC society members and prospective members to attend our annual fun social on Tuesday, 12 September 2000, 5:30pm - 8:00pm.  The purpose of this event is to promote interaction and discussion about useful topics for the technical sessions to be held during the 2000-2001 season, and to have a good time.  The chapter also invited prospective speakers to attend this session and submit their presentation for consideration.
             Suggested topics include: measurements (techniques, technology, problems, corrections, calibration); test facilities (shielded rooms, open field test sites, screen rooms, anechoic and semi-anechoic chambers); EM noise sources and studies; design for reduced noise; ESD; antennas and propagation; EMC standards and regulations; EMC and Signal Integrity issues, wireless topics, and computer aided analysis and design.

Anyone interested in presenting an outline of these or other related topics should contact Tom Cokenias ([email protected]) at (650)726-1263.
 
For more information about this newsletter and its distribution or questions whether this publication can be received electronically, please contact the editor, Neven Pischl ([email protected]) at (408) 527-7874.
 
The meeting will be held at SGI, the Restaurant in Building 40, 1600 Amphitheater Pkwy Mountain View, CA 94043. A map with the location of the SGI campus is available in this newsletter.

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October 2000 Meeting Notice

When/Where:
             Tuesday, October 10, 2000.  SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
"Bluetooth�  - A Viking King" - Kurt Fisher
Details:
This month�s topic is �Bluetoothtm�, a new 2.4 GHz wireless standard for communication between devices, named after a 10-th century king of Denmark. More information can be found at www.bluetooth.com.

We will hear about Bluetooth from Kurt Fisher, president of Hyper Corporation. A major concern is whether various wireless devices based on several standards or specifications can peacefully coexist within the same 2.4GHz band. The IEEE 802.15 Coexistence Task Group (TG2) addresses the issue of coexistence between Wireless Personal Area Networks (WPANs) and other wireless devices, such as the IEEE 802.11 Wireless Local Area Networks (WLANs). IEEE 802.11 is a wireless extension to Ethernet that is expected to be widely deployed in office and home environments over the next few years. The Coexistence Task Group was recently formed and has established as its goals to fully characterize and understand the effects of mutual interference and to produce a Recommended Practice for WPAN devices operating in a WLAN environment. An extended vision is to assist standards development in minimizing the potential for interference among different radio systems in the unlicensed bands.

Kurt is a member of Bluetooth Test and Interoperability Working Group, a Bluetooth Qualification Body, and a voting member of IEEE 802.15 WLAN. Appointed the first Bluetooth Qualification Body (BQB) in North America, Kurt Fischer, President of Hyper Corporation has over twenty years of experience in conformity assessment services for high technology electronics. He is a member of the Bluetooth Technical Advisory Board (BTAB), a Certified A2LA Lead Laboratory Assessor and BQTF Technical Assessor, a voting member of IEEE 802.15 Working Group on Wireless Personal Area Networks (WPAN), and a NARTE Certified EMC Engineer. He listed the first product on the Bluetooth Qualified Product List. He has an extensive background in conformity assessment in the wireless and telecom industries. Kurt has had two articles on Bluetooth Qualification published this past December, and February in Approval Magazine.

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November 2000 Meeting Notice

When/Where:
             Tuesday November 14th, The Oak Room, Building 48 at Hewlett Packard, Pruneridge Ave., Cupertino, CA.
Topic/Speaker:
Details Forthcoming
Details:

Werner Schaefer is currently a senior compliance engineer with Cisco Systems, corporate complinace department, in San Jose, California. His educational background includes degrees received from the Technical University in Darmstadt, Germany (RF and Microwave Major, MSEE, received in 1982), and the Hochschule f�r Berufst�tige, Germany (Marketing Major, MBA, received in 1990).

  He joined Hewlett-Packard (HP) Company in Frankfurt, Germany as a Microwave Systems Engineer in 1983. He has worked at HP and Agilent Technologies, Inc. as an EMC business development manager, EMC Product Marketing Engineer, EMI Software Design Engineer and Technical Contributor for EMC applications. As of May 2000 he is responsible for EMC standards work and EMC test development at Cisco Systems, Inc.

  He has 15 years of EMC experience involving extensive conducted and radiated emissions measurement practices, Open Area Test Site qualification and antenna calibration, measurement equipment calibration (e.g. LISNs, antennas, EMI receivers, spectrum analyzers), semi-anechoic chamber verification, measurements of shielded effectiveness (cables and shielded rooms), EMI troubleshooting, development of EMI software, development of conformity modules and check lists for emissions measurement assessments of EMC laboratories, assessments of EMC laboratories and development and teaching of EMC classes at universities.

  Mr. Schaefer is an active member of CISPR/A, CISPR/H, ANSI C63, SC1, SC3, SC6, TC 77B, SAE-AE4, ASQ, the IEEE EMC society and the VDE in Germany. He was appointed as a Distinguished Lecturer of the EMC Society in March 2000 for the years 2000-2001.

  Mr. Schaefer is a NARTE certified EMC engineer and an assessor for EMC laboratories for A2LA. He has published many papers on EMI and microwave measurements and has co-authored a book on microwave measurement techniques.

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December 2000 Meeting Notice

When/Where:
              Tuesday, December 12, 2000.  SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
"Equipotentiality and Grounding - Derivation of grounding resistance for equipment. -Richard Nute"
Details:
  Richard Nute has been in the field of product safety since 1973. Prior to that, he was a manufacturing engineer, R&D engineer, and engineering manager. 

  He received his Bachelor of Physics degree from California State Polytechnic University, San Luis Obispo. 

  He has participated on national and international standards committees and contributed to those standards. He is currently a member of ECMA TC-12, working on the generic safety standard. 

  He is author of "Technically Speaking," a regular column of the Product Safety Newsletter. Some of these articles have been re-published in national and international magazines. He is author of "Dynamic Aspects of Body Impedance," appearing in Electrical Shock Safety Criteria, Proceedings of the First International Symposium on Electrical Shock Safety Criteria, edited by J.E. Bridges, Pergamon Press. He is co-author and teacher of "Hazard Based Safety Engineering," a Hewlett-Packard Company proprietary course in product safety.

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January 2001 Meeting Notice

When/Where:
             Tuesday, January 9, 2001.  SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
             "The Basic Physics of Electromagnetics Without Abstract Mathematics" - Scott Bennett (retired)
Details:
Abstract - The basic point source of electromagnetic fields -- the charge element -- is derived and described with basic physics and high-school mathematics.  The charge element is a simpler point source than the current element -- it has five field components, whereas the current element has seven -- yet these two basic field sources are shown to be equivalent.  

  The physical causes of the two H-field and three E-field components of the charge element are easily explained, and they are kept obvious with the descriptions derived for those components.  Simple examples are then given to show how to use charge elements to better understand the fields of full-size currents, and the physical origins of those fields.

Speaker Bio - Scott Bennett was a radar repairman in the USAF (1948-52); an EE student at PA State University (1952-55); a Field Service Tech. for GE Co. (1955-60); and an EE student at Syracuse University (1960-67).  At Syracuse he earned the BEE ('63), MSEE ('65), and PhD ('67); he was a NASA Fellow while earning the MSEE, and an Instructor of EE while earning the PhD.  

  Scott then was an Assistant Prof. at VA Polytechnic Institute (VPI) from 1967 to 1970; a Staff Engineer for Burroughs Corp. in City of Industry, CA from 1970 to 1974, and an MTS of Hewlett-Packard Co. in Loveland and Fort Collins, CO from 1974 to 1990. He taught a senior level course in electromagnetics at VPI for three years, and he specialized in EMC at HP for 13 years.  Since his "retirement" in 1990, he has been working harder than ever -- to free electromagnetics from the abstract mathematics with which it is usually taught, and treat it more like the physical science it is.

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February 2001 Meeting Notice

When/Where:
          Tuesday, February 13, 2001.  SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
             "Emerging Standards for Europe" - Jerry Ramie
Details:
The "New Approach Directives" of the European Union mandate new and expanded testing for Regulatory Compliance for most electrical & electronic products.  These Standards affect a vast array of products, some of which have not been subject to such rigorous testing in the past.  The important changes to the EMC Directive (89/336EEC) and their impact on our company's products are discussed in this presentation.  

                    EN61000-4-5   Lightning Strike (Surge)
                    EN61000-4-6   Confucted RF Immunity
                    EN61000-4-8   50 Hz Magnetic Fields
                    EN61000-4-11   Power Dips & Interrupts
                    EN61000-3-2   Power Harmonics
                    EN61000-3-3   Power Flicker
                    EN55022/1998  the "New CISPR 22" tests for ITE & Telecoms

         This is essential information on the newly mandated tests required during 2001.  Early knowledge of these "Emerging Standards" and        
         their impact on your design and marketing plans will put you far ahead of your competition.

         The speaker is Jerry Ramie of ARC Technical Resources, Inc., a 20-year veteran of Regulatory Compliance, EMC, and RF/Microwave
         measurement instrumentation.

         From 1985 to Present, Jerry has worked in the Manufacturer's Representative business here in the West, with membership in the dB Society
         and the IEEE-EMC Society Recognition Award for 1997-98 (Santa Clara Valley section) Jerry co-founded Compliance Systems
         Corporation in 1998 to integrate various brands of equipment into complete EMC systems.

         In the early '80's Jerry was a Field Sales Engineer with EATON Corp. involving the EMC Test Equipment & Systems, RF & Microwave 
         Spectrum Analyzers, Synthesized Signal Generators, AC Products, Noise Figure Equipment, and Broadband Linear Amplifiers for Military and 
         Commercial test installations.

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March 2001 Meeting Notice

When/Where:
Tuesday, March 13, 2001. SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
 "Optimizing GBE Idle Pattern for Better EMC Performance" - Todd Knibbe
 Details:

BIO:
 BS+MS in Electrical Engineering from Massachusetts Institute of Technology 1993. Worked for MIT Lincoln Laboratory on satellite free-space laser communication links 1991-1994. Worked for Hughes Network Systems designing satellite radio transceivers (DirecTV) 1994-1999. Currently an Applications Engineer with Agilent Technologies.
ABSTRACT:
 Of all the possible data patterns used in a Gigabit-Ethernet system, the Idle Pattern dominates the EMC emissions. It is typically used as a worst case scenario for EMC characterization and testing. This is because in many systems, the steady state Idle Pattern consists of a repeating 20-bit sequence, causing a very distinct emissions spectrum which can be radiated by high-speed serial components when no data is being sent. However, the Gigabit Ethernet standard allows for some flexibility in the implementation of Idle Pattern. Software/Firmware can be modified to lengthen/randomize the Idle Pattern, lowering peak emissions and improving EMC compliance dramatically. Reduced emissions in a multi-port Gigabit Ethernet system using these alternative Idle Patterns was demonstrated. The 10-Gigabit Ethernet Alliance is already applying these lessons to reduce Idle Pattern emissions in next generation 10-gigabit Ethernet systems.
OUTLINE:
 Introduction
GbE Idle Pattern and EMC Performance in GbE systems 8B/10B Encoding Basic discussion of 8B/10B encoding system used by GbE systems Idle Pattern Implementation of GbE Idle Pattern using 8B/10B encoding Initial Experiment Initial experiment with alternative GbE Idle Patterns to reduce EMI EMC Testing of Alternative GbE Idle Patterns EMC testing with commercial system and alternative GbE Idle Patterns 10GbE Committee Recommendations Alternative (Randomized) Idle Pattern included in 10GbE standard.

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April 2001 Meeting Notice

When/Where:
Tuesday, April 10th, 2001. SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
"Radiated Emissions Measurements Above 1 GHZ"  -Tom Cokenias

Details:

Radiated field strength measurements at frequencies above 1 GHz are becoming common requirements for a wider range of equipment than ever before. In addition to case radiated measurements from licensed transmitters, and restricted band emissions from FCC Part 15 devices and for ISM equipment, ITE equipment is now included as one of the categories requiring testing to microwave frequencies. The current 1GHz microprocessors and the 2 GHz processors in development are pushing testing requirements up to the 5 - 10 GHz range.  The presentation will review the regulations requiring measurements above 1 GHz for ITE and other types of equipment. Specialized test equipment, such as horn antennas, boresight antenna masts, low loss flexible coaxial cables, and harmonic mixers will be discussed.

There will also be discussion of test methodology.  Published test procedures often lack the level of detail that is necessary to make repeatable and accurate measurements. The narrow beam widths of the measurement antennas and the highly directional nature of the emissions require careful search procedures to accurately measure maximum field strengths, and slight differences in technique can
result in level measurements that can differ by more than 10 dB.

BIO:

Tom Cokenias has been in the RF regulatory field for over 25 years.  He spent 8 years working as an electronic engineer in the Equipment Authorization Branch of the FCC Laboratory in Columbia, MD. Since 1983 has held senior engineering positions at a number of EMC laboratories in the Bay area, most recently as Director of Engineering at Compliance Certification Services. He is also owner and chief consultant at T.N. Cokenias Consulting in El Granada, CA.

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May 2001 Meeting Notice

 When/Where:
Tuesday, May 8th, 2001. SGI, 1600 Ampitheater Parkway, Mt. View, CA. building 40, in the Presentation Center above the lobby.
Topic/Speaker:
"Parallel Traces are Just the Beginning: A Primer on Four Printed Circuit Board Coupling Mechanisms"  -Dr. Zorica Pantic-Tanner; Franz Gisin

Details:
As high speed digital clocks, timing, and data signals cross over into the GHz frequency range, the traditional lumped element L-C (inductive-capacitive) crosstalk model is not sufficient to explain all the coupling mechanisms occurring between conductors on a printed circuit board.  At higher frequencies, other printed circuit board structures cause EMC and signal integrity engineers grief. These include vias, routing traces across breaks in ground and power planes, and reflections from PCB edges. The presentation will briefly review the L-C crosstalk mechanism, and then explore how the other three structures can also create coupling paths between PCB conductors. The presentation will also cover practical examples of mitigation techniques that can be used to minimize all four coupling mechanism.

Biography:

Dr. Zorica Pantic-Tanner is Director of the SFSU School of Engineering, and Director of the SFSU Center for Applied Electromagnetics, a research facility that provides resources for theoretical and experimental studies in applied electromagnetics. She received her B.S., M.S., and Ph.D. degrees in Electrical Engineering from the University of Nish in 1975, 1978, and 1982, respectively. After graduating she became an Assistant Professor and then Associate Professor in the Department of Electronic Engineering at the University of Nish. In 1984 she was awarded a Fulbright Scholarship for
postdoctoral research in the area of Applied Electromagnetics with the Electromagnetics & Communications Lab of the University of Illinois at Urbana-Champaign. In 1989 she joined the School of Engineering at San Francisco State University. Dr. Pantic-Tanner's research and teaching interests are in the areas of Electromagnetic Field Theory, Applied Electromagnetics and Electromagnetic Compatibility (EMC). She has published over 50 conference and journal papers in these areas. Dr. Pantic-Tanner is Chair of the Santa Clara Valley Chapter of the IEEE EMC Society, a member of
the IEEE EMC Society Education Committee, and Vice-Chair of the IEEE EMC Society Technical Committee TC-9 on Computational Electromagnetics. Under the IEEE EMC Society sponsorship, she has also developed and taught several EMC courses.

Franz Gisin is EMC/Signal Integrity Design Manager at Sanmina Corporation.  He received his B.S. degree in electrical engineering from the University of Idaho in 1972, and his M.S. degree in Applied Mathematics from the University of Santa Clara in 1986. Franz has been active in the EMC community for over 27 years, and has published numerous papers ranging from measurement uncertainties associated with 1/R extrapolation on OATS to mechanisms of common mode radiation from PCBs with attached cables. He is a past EMC Society Distinguished Lecturer and a past member of the EMC Society Board of Directors. Currently he is steering committee chair of the 2004 IEEE International Symposium on Electromagnetic Compatibility. He also teaches electromagnetics at SFSU.

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