1995/1996 Monthly Chapter Meeting Notices
- September 11, 1995: Annual Social and Planning
Session
- October 10, 1995: "Power, Ground and
Signal 'Bounce' in High Speed Digital Circuitry" by Dr. Jim Parker,
Fujitsu Computer Packaging Technologies, Inc.
- November 14, 1995: "Calibration Of Fully
Anechoic Rooms And Correlation With Oats Measurements" by Roger A.
McConnell and Clark Vitek, CKC Laboratories, Inc.
- December 12, 1995: "Lightning and
Transients Protection".by Dr. Norman Violette.
- January 9, 1996: A Clinical and Public Health
Approach to Assess the Potential for Hand-held Wireless Communication
Instruments to Interfere with Implanted Pacemakers by Dr. Don McRee of
Wireless Technology Research, L.L.C. (WTR).
- February 13, 1996: System Level EMC Design
by Ron Brewer of Instrument Specialties.
- March 12, 1996: An Overview of the European
Community Requirements for Harmonic Currents and Flicker (IEC 555-2,3 IEC
1000-3-2,3, and EN60555-2,3) by John M. White, Behlman Electronics, Inc.
and David Hightower, Valhalla Scientific.
- April 9, 1996: "Conducted Immunity EMC
Testing" by Joe Fischer, Fischer Custom Communications, Inc.
- May 14, 1996: "An Overview of Numerical
Modeling Techniques for EMC" by Prof. Todd Hubing, University of
Missouri-Rolla.
September '95 Meeting Notice
- When/Where
- Tuesday, September 11, 1995. Bold Knight Restaurant, Sunnyvale, CA, 5:00 PM
til .....
- Topic/Speaker
- Annual Social and Planning Session
- Details
- The Santa Clara Valley Electromagnetic Compatibility Society invites all
EMC society members and prospective members to attend a social and planning
session on Tuesday, September 11 at 5:00 to 8:00 p.m. The meeting will be held
at the Bold Knight Restaurant in Sunnyvale. Refreshments and hors d'oeuvres
will be served.
The purpose of this event is to promote interaction and
discussion about useful topics for the technical sessions to be held during the
1995-1996 season. The chapter also invites prospective speakers to attend this
session and submit presentation outlines for consideration.
Suggested
topics include: measurements (techniques, technology, problems, corrections,
calibration); test facilities (shielded rooms, open field test sites, screen
rooms, anechoic and semi-anechoic chambers); EM noise sources and studies;
design for reduced noise; electrostatic discharge; antennas and propagation; EMC
standards and regulations; and computer aided analysis and design.
Anyone
interested in presenting an outline of these or other appropriate topics should
contact Franz Gisin at (408) 492-3543.
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October '95 Meeting Notice
- When/Where
- Tuesday, October 10, 1995. Apple Computers, 4 Infinity Loop, Cupertino,
CA. Dinner in the Piano Bar at 5:30 PM, technical presentation in the
auditorium across the hall from the Piano Bar at 7:30 PM.
- Topic/Speaker
- "Power, Ground and Signal 'Bounce' in High Speed Digital
Circuitry" by Dr. Jim Parker, Fujitsu Computer Packaging
Technologies, Inc.
- Details
- High speed digital circuits (particularly CMOS) demand short-duration
current pulses while switching. This current must be provided by a (preferably
very low impedance) power distribution network. The resulting I*Z voltage "bounce"
can degrade normal circuit operation. Besides causing a momentary "brown
out" of the power supply voltage, this transient competes with cross talk
in consuming an allowable noise budget for the circuit design. Assessing these
effects quantitatively requires accurate electrical models of the power and
ground planes. These two planes are "accessed" (i.e. - excited
electromagnetically) from the physical network's interconnect vias. Measured
TDR and TDT (Time Domain Transmission) data having 50 picosecond rise time is
utilized to illustrate the propagation and subsequent reflections of bounce
voltage throughout a rectangular pair of power-ground planes. A corresponding
analytical model is then developed for the open circuit impedance parameters
between any pair of vias. When these frequency domain network parameters are
inverse Fourier transformed back into the time domain, excellent agreement with
measured data is demonstrated. The observed wave-physics phenomena is related
to the simpler network port voltages and currents by utilizing radial
transmission line concepts. These concepts are systematically developed
starting with lineal transmission lines. Insight into the various physical
mechanisms is stressed, while maintaining rigorous final results.
Jim
Parker is a Senior Research Scientist at Fujitsu Computer Packaging
Technologies, Inc., where he specializes in electromagnetic analysis and
modelling. After completing BSE, MSE and PhD degrees (all in EE) at the
University of Michigan, he worked 11 years for Bell Telephone Laboratories in
New Jersey. In 1981 Jim formed an EMC Group at Data General Corp., and then in
1984 the EMC Engineering Department at Apollo Computer, Inc. He remained at
Apollo (and subsequently Hewlett-Packard) for 7 years, specializing in both
Regulatory and Signal Integrity issues. Jim is a Senior Member of the IEEE,
Chairs the EMC Society's Technical Committee on Interference Control, and is a
Registered Professional Engineer in the State of New Jersey.
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November '95 Meeting Notice
- When/Where
- Tuesday, November 14, 1995. Apple Computers, 4 Infinity Loop, Cupertino,
CA. Dinner in the Piano Bar at 6:00 PM, technical presentation in the
auditorium across the hall from the Piano Bar at 7:30 PM.
- Topic/Speaker
- Calibration Of Fully Anechoic Rooms And Correlation With Oats
Measurements by Roger A. McConnell and Clark Vitek, CKC Laboratories,
Inc.
- Details
- Fully anechoic rooms may gradually replace open area test sites as the
preferred type of testing facility. The fully anechoic room offers several
advantages over the open area test site: Immunity to high ambient signals, the
capability of being located in metropolitan areas close to those needing testing
facilities, the ability to obtain maximized emissions at a fixed antenna height,
and the capability of being used for both emissions and immunity testing.
Open
Area Test Sites are required by the FCC to meet the Normalized Site Attenuation
(NSA) Standards published in ANSI C63.4. CISPR 22, Second Edition also provide
NSA values for OATS calibration. Comparable NSA standards for free space, and
thus for an ideal fully anechoic chamber, are readily calculated using the
following equations NSA = 278.9/(Fm*Ed) where Fm is the measurement frequency
and the field strength Ed is calculated from : Ed = Sqrt(49.2)/D where D is the
distance separating the two antennas. These two equations can be used to
generate free space NSA values for any test distance desired.
In
addition to calibrating the fully anechoic room, in order to be used for
emissions measurements, it is necessary to demonstrate that the radiated
emissions measured from an EUT in the fully anechoic chamber are equivalent to
emissions measurements made on the same EUT on an OATS. Methods of demonstrating
this equivalency are presented, along with actual measured data.
Roger
McConnell has been with CKC Laboratories. Inc. in Mariposa, CA since 1986. His
primary EMC activities have been in open field range calibration, anechoic room
performance, and energy transfer in EMP. He has been a member of the Society of
Automotive Engineers AE4R Subcommittee which has been advising the FAA in
connection with the threat to aircraft from high energy rf fields. At CKC, he
has engineering responsibility for the operation of the Mariposa Semi-Anechoic
facility.
Prior to his employment at CKC, Mr. McConnell was employed
for 24 years at the Stanford Linear Accelerator Center in technical support of
high energy physics research. He specialized in the design of very high power cw
rf systems, accelerator cavities and phase stable transmission lines. He has
coauthored a number of papers relating to particle accelerator radio frequency
systems which have appeared in the IEEE symposiums on Nuclear Science, and has
authored six papers on open field range calibration and EMP which have appeared
in the IEEE Symposiums on EMC. Mr. McConnell is a graduate in electrical
engineering (1958) from the University of California at Berkeley, and holds the
position of Senior Consultant at CKC Laboratories.
Clark Vitek is a
member of the IEEE and AAMI, and has published articles on EMC at symposiums and
in industry periodicals. His present position at CKC Laboratories is Consulting
EMC Engineer / Pacific Northwest Regional Manager based at CKC's Hillsboro,
Oregon facility. Mr. Vitek has overseen the development of two of CKC's Fully
Anechoic Chambers: the 3.0m x 7.5m x 3.0m (w,l,h) chamber in Fremont, CA and the
6.0 x 8.0 x 3.0 (w,l,h) chamber in Hillsboro. He is a graduate in Electrical
Engineering from the University of California, at Davis, with course work
emphasis in RF and Microwave design.
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December '95 Meeting Notice
- When/Where
- Tuesday, December 12, 1995. Apple Computers, 4 Infinity Loop, Cupertino,
CA. Dinner in the Piano Bar at 6:00 PM, technical presentation in the
auditorium across the hall from the Piano Bar at 7:30 PM.
- Topic/Speaker
- Lightning and Transients Protection by Dr. Norman Violette.
- Details
- The SCV Electromagnetic Compatibility Chapter and the SCV/EMC Product
Safety Technical Committee will hold a joint meeting on Tuesday, December 12,
1995, to hear a presentation by Dr. Norman Violette on "Lightning and
Transients Protection".
The presentation will cover a wide range
of lightning and transient related topics ranging from the Statue of Liberty
Lightning Protection Project to circuit level protection devices. Dr. Violette
will start the presentation with an overview of lighning basics, the physics of
direct and indirect strikes, and how lightning can couple and interact with with
power and signal lines. He will then progress to protection methods at the
equipment level and cover such areas as design waveforms, and the advantages and
disadvantages of various protection components and devices. Also included will
be a general discussion of system level design considerations such as protection
device coordination. At the conclusion of the presentation, he will describe
the techniques used to provide lightning protection for the Statue of Liberty.
Dr.
Norman Violette is one of the leading authorities on lightning and lightning
protection in the United States. He received a BEE from Rensselear Polytechnic
Institute, an MBA from Auburn University, and a PhD (EE) from North Carolina
State University. He is a Registered Professional Engineer in the state of
Virgina, and a member of the Board of Directors of the Lightning Protection
Institute. He is a Distinguished Lecturer in the IEEE EMC Society.
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January '96 Meeting Notice
- When/Where
- Tuesday, January 9, 1995. Cocktails (5:00 pm) and dinner (5:30 pm) at
Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino.
Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
- Topic/Speaker
- A Clinical and Public Health Approach to Assess the Potential for
Hand-held Wireless Communication Instruments to Interfere with Implanted
Pacemakers by Dr. Don McRee of Wireless Technology Research, L.L.C.
(WTR).
- Details
- With rapidly expanding use of wireless technologies, concen has been raised
about potential electromagnetic interference with implantable devices. WTR, an
independent research group concerned with potential health effects from wireless
communication technology, is sponsoring a multi-center clinical study to assess
the potential for hand-held wireless phone technologies to interfere with
implanted pacemakers. The study is being conducted at the Mayo Clinic, the New
England Medical Center, and the University of Oklahoma Health Sciences Center.
The study will provide comprehensive, clinically relevant information on the
prevalence of interference in approximately 1200 patients with implanted
pacemakers set at their clinically appropriate settings wihile using a series of
hand-held wireless telephone technologies. The presentation will focus on the
origin of the concern, the research program put in place to address the
question, and the clinical work being conducted.
Don McRee is the
Director of Extramural Research for WTR, which is an independent research group
established to assess the safety of wireless communication instruments. Before
coming to WTR, he served as the Chief of both the Scientific Review Branch and
the Environmental Health Resources Branch within the Division of Extramural
Research at the National Institute of Environmental Health Sciences in Research
Triangle Park. Dr. McRee has also been a professor at North Carolina State
University. He has published over one hundred papers and abstracts in the area
of bioelectromagnetic effects in the microwave frequency range, and has sat on
numerous government and other committees in related fields. Dr. McRee earned a
Ph.D. in Engineering Science from North Carolina State University and a M.A. in
Physics from the College of William and Mary. He belongs to the American
Association for the Advancement of Science, the Bioelectromagnetics Society, and
the Health Physics Society. Dr. McRee has received the National Institute of
Health´s Director´s Award and several Public Health Service Awards,
and he has been listed in Who´s Who.
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February '96 Meeting Notice
- When/Where
- Tuesday, February 13, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at
Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino.
Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
- Topic/Speaker
- System Level EMC Design by Ron Brewer of Instrument
Specialties.
- Details
- Systems EMC problems have plagued the communications/electronics industry
since the late 1800's. This is significant because these early problems
preceded the invention of the triode vacuum tube. When the amplification of low
level signals became possible the EMC problems became much worse because
circuits could now respond to lower level interfering signals. Fortunately,
there were few electronics devices to interfere! Today things are much
different.
This presentation provides an introduction to systems EMC design. It
provides a brief overview of the EMC problem and then covers printed circuit
board considerations, differential and common mode trace and cable EMC
hardening, and shielding for RF emission and susceptibility (immunity) control.
The shielding design as emphasized in this presentation can be applied to
existing systems without impacting circuit operation. It is the only
suppression technique that can be used in this way. Topics that will be covered
include examples of interference conditions, emitters and receptors, spectrum
control, radiated emission and susceptibility, PCB layout and design
considerations, Differential Mode/Common Mode trace and cable noise reduction,
shielding effectiveness, containment/exclusion, aperture integrity, RF gasket
types, and corrosion.
Ronald W. Brewer is Vice President, EMC Technical
Services for Instrument Specialties Co., Inc. Ron is a NARTE Certified EMC
Engineer with 25 years experience in EMC/TEMPEST design. He has written a
number of technical articles on EMC design for systems/PCB and holds several
patents. An internationally recognized EMC authority, he has made over 150 EMC
technical presentations in 17 countries. Named Distinguished Lecturer by the
IEEE EMC Society, Ron holds a BSE(engr. sci.) and a Ced(physics) form the
University of Michigan, Ann Arbor.
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March '96 Meeting Notice
- When/Where
- Tuesday, March 12, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at
Chillis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino.
Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
- Topic/Speaker
- An Overview of the European Community Requirements for Harmonic
Currents and Flicker (IEC 5555-2,3 IEC 1000-3-2,3, and EN60555-2,3) by
John M. White, Behlman Electronics, Inc. and David Hightower, Valhalla
Scientific.
- Details
- Electrical and Electronic apparatuses destined for the European Community
are required to withstand a level of immunity so as not to be adversely affected
by outside electromagnetic influences. They must also not cause undue
interference with other devices. Specifically, IEC 555-2/1000-3-2 (EN60555-2)
and IEC 555-3/1000-3-3 (EN60555-3) prescibe specific testing methods, limits and
required equipment necessary to ensure products comply with acceptable levels of
power line harmonics and flicker. This presentation will explore the technical
requirements of these standards and provide an outline of essential test and
measurement equipment.
John M. White is the Western Regional Sales
Manager for Behlman Electronics, Inc. Since joining Behlman in 1985, he has
also held postions ranging from Applications Engineer through Advanced Planning
and New Product Development. He is author of numerous technical articles on
topics of product testing and International Standards Evaluation. Mr. White
received his MBA from California Lutheran University, and his BS in Avation
Technology and Management form Western Michigan University.
David
Hightower has 23 years of experience in the electronics field. He has been with
Valhalla Scientific for the past 14 years, and is currently an Applications
Engineer.
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April '96 Meeting Notice
- When/Where
- Tuesday, April 9, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at
Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino.
Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
- Topic/Speaker
- "Conducted Immunity EMC Testing" by Joe Fischer,
Fischer Custom Communications, Inc.
- Details
- European Ecomonic Community Immunity requirements such as those referenced
in IEC Standard 1000-4-6 relate to the conducted immunity requirements of
electrical and electronic equipment to electromagnetic distubances coming from
intended radio-frequency (RF) transmitters in the frequency range 9 KHz up to
80 MHz. These transmitters generate electromagnetic fields that can induce RF
voltages and currents on cables connected to electrical and electronic
equipment. These cables include power mains, communications lines, interface
cables, and control lines. These induced voltages and currents can then
propagate into the equipment, causing the equipment to malfunction.
Typically,
the conducted immunity test method subjects the equipment under test to a
source of disturbance that simulates those coming from intentional RF
transmitters. Using this test method, coupling and decoupling networks are
used to apply the disturbing signal to one cable at a time, while keeping all
other cables non-excited. The characteristics of the coupling and decoupling
networks are defined in the test specification.
Joe Fischer will
present the rationale, test requirements, and RF magnitudes that are injected
into the equipment. In addition, test methodolgies and test equipment
characteristics will also be discussed as well as factors that affect the RF
power amplifier requirements. Joe Fischer has been involved in EMC and EM
sensor design for the last 45 years. He is a past president of the IEEE EMC
Society, and has served as a distinguished lecturer. He is the founder of
Fischer Custom Communications, Inc, and still actively involved in development
activities.
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May '96 Meeting Notice
- When/Where
- Tuesday, May 14, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis,
20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino.
Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
- Topic/Speaker
- "An Overview of Numerical Modeling Techniques for EMC"
by Dr. Todd Hubing, University of Missouri-Rolla.
- Details
- Purchasing electromagnetic modeling software is somewhat like buying a used
car, except most people who buy a car already know how to drive. Numerical EM
modeling software can be a powerful asset in the hands of an experienced EMC
engineer who is well-versed in the use of (and limitations of) a particular
software package. But numerical modeling software won't tell the user what to
model or how to model it. Despite the claims of many vendors, numerical modeling
software is not easy to use and it can't really help you to isolate the source
of an EMC problem unless you already have a pretty good idea of what that source
is.
Can EM modeling software help product engineers to meet EMC
requirements? Yes, it can! However, before investing hundreds or thousands of
dollars in software, take the time to evaluate your company's needs and
expectations. Who will be using the software, the circuit designer, the EMC
engineer, or an EM modeling specialist? What kind of information or answers do
you expect to get from the software? Do you need software that is analytical,
numerical, or expert system based? Which numerical method is best suited to your
needs, the method of moments, the finite element method, FDTD, or something
else? What about design rule checkers, EMC modeling environments, or automated
EMI prediction algorithms? Are they any good?
Prof. Todd Hubing of the University of Missouri-Rolla has been using
commercial and non-commercial EM modeling software to model EMC problems for
many years. He is familiar with nearly every EM modeling code marketed to the
EMC community. At the May IEEE EMC Society Chapter meeting, he will review the
various types of EM modeling software available commercially and over the
internet. The purpose of this review is to help product developers and EMC
engineers decide whether they can benefit from EM modeling software and which
software packages are appropriate for their particular application. He will
also discuss EMC modeling strategies (with and without a computer) as they apply
to real products under development or to existing products with EMC problems.
Todd Hubing is an Associate Professor at the University of
Missouri-Rolla and one of the principal faculty in the UMR Electromagnetic
Compatibility Laboratory. He holds a BSEE degree from the Massachusetts
Institute of Technology, an MSEE degree from Purdue University, and a Ph.D. in
Electrical Engineering from North Carolina State University. Prior to joining
the faculty at the University of Missouri-Rolla in 1989, Todd spent seven years
in the "real world" as an EMC engineer at IBM in Research Triangle
Park, North Carolina. Todd is a senior member of the IEEE and is on the EMC
Society's Board of Directors. He has authored or presented more than 60
technical papers, presentations, and reports on electromagnetic modeling and
other EMC-related subjects. He also writes the Chapter Chatter column for the
EMC Society Newsletter.
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