1995/1996 Monthly Chapter Meeting Notices

September '95 Meeting Notice

When/Where
Tuesday, September 11, 1995. Bold Knight Restaurant, Sunnyvale, CA, 5:00 PM til .....
Topic/Speaker
Annual Social and Planning Session
Details
The Santa Clara Valley Electromagnetic Compatibility Society invites all EMC society members and prospective members to attend a social and planning session on Tuesday, September 11 at 5:00 to 8:00 p.m. The meeting will be held at the Bold Knight Restaurant in Sunnyvale. Refreshments and hors d'oeuvres will be served.

The purpose of this event is to promote interaction and discussion about useful topics for the technical sessions to be held during the 1995-1996 season. The chapter also invites prospective speakers to attend this session and submit presentation outlines for consideration.

Suggested topics include: measurements (techniques, technology, problems, corrections, calibration); test facilities (shielded rooms, open field test sites, screen rooms, anechoic and semi-anechoic chambers); EM noise sources and studies; design for reduced noise; electrostatic discharge; antennas and propagation; EMC standards and regulations; and computer aided analysis and design.

Anyone interested in presenting an outline of these or other appropriate topics should contact Franz Gisin at (408) 492-3543.
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October '95 Meeting Notice

When/Where
Tuesday, October 10, 1995. Apple Computers, 4 Infinity Loop, Cupertino, CA. Dinner in the Piano Bar at 5:30 PM, technical presentation in the auditorium across the hall from the Piano Bar at 7:30 PM.
Topic/Speaker
"Power, Ground and Signal 'Bounce' in High Speed Digital Circuitry" by Dr. Jim Parker, Fujitsu Computer Packaging Technologies, Inc.
Details
High speed digital circuits (particularly CMOS) demand short-duration current pulses while switching. This current must be provided by a (preferably very low impedance) power distribution network. The resulting I*Z voltage "bounce" can degrade normal circuit operation. Besides causing a momentary "brown out" of the power supply voltage, this transient competes with cross talk in consuming an allowable noise budget for the circuit design. Assessing these effects quantitatively requires accurate electrical models of the power and ground planes. These two planes are "accessed" (i.e. - excited electromagnetically) from the physical network's interconnect vias. Measured TDR and TDT (Time Domain Transmission) data having 50 picosecond rise time is utilized to illustrate the propagation and subsequent reflections of bounce voltage throughout a rectangular pair of power-ground planes. A corresponding analytical model is then developed for the open circuit impedance parameters between any pair of vias. When these frequency domain network parameters are inverse Fourier transformed back into the time domain, excellent agreement with measured data is demonstrated. The observed wave-physics phenomena is related to the simpler network port voltages and currents by utilizing radial transmission line concepts. These concepts are systematically developed starting with lineal transmission lines. Insight into the various physical mechanisms is stressed, while maintaining rigorous final results.

Jim Parker is a Senior Research Scientist at Fujitsu Computer Packaging Technologies, Inc., where he specializes in electromagnetic analysis and modelling. After completing BSE, MSE and PhD degrees (all in EE) at the University of Michigan, he worked 11 years for Bell Telephone Laboratories in New Jersey. In 1981 Jim formed an EMC Group at Data General Corp., and then in 1984 the EMC Engineering Department at Apollo Computer, Inc. He remained at Apollo (and subsequently Hewlett-Packard) for 7 years, specializing in both Regulatory and Signal Integrity issues. Jim is a Senior Member of the IEEE, Chairs the EMC Society's Technical Committee on Interference Control, and is a Registered Professional Engineer in the State of New Jersey.
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November '95 Meeting Notice

When/Where
Tuesday, November 14, 1995. Apple Computers, 4 Infinity Loop, Cupertino, CA. Dinner in the Piano Bar at 6:00 PM, technical presentation in the auditorium across the hall from the Piano Bar at 7:30 PM.
Topic/Speaker
Calibration Of Fully Anechoic Rooms And Correlation With Oats Measurements by Roger A. McConnell and Clark Vitek, CKC Laboratories, Inc.
Details
Fully anechoic rooms may gradually replace open area test sites as the preferred type of testing facility. The fully anechoic room offers several advantages over the open area test site: Immunity to high ambient signals, the capability of being located in metropolitan areas close to those needing testing facilities, the ability to obtain maximized emissions at a fixed antenna height, and the capability of being used for both emissions and immunity testing.

Open Area Test Sites are required by the FCC to meet the Normalized Site Attenuation (NSA) Standards published in ANSI C63.4. CISPR 22, Second Edition also provide NSA values for OATS calibration. Comparable NSA standards for free space, and thus for an ideal fully anechoic chamber, are readily calculated using the following equations NSA = 278.9/(Fm*Ed) where Fm is the measurement frequency and the field strength Ed is calculated from : Ed = Sqrt(49.2)/D where D is the distance separating the two antennas. These two equations can be used to generate free space NSA values for any test distance desired.

In addition to calibrating the fully anechoic room, in order to be used for emissions measurements, it is necessary to demonstrate that the radiated emissions measured from an EUT in the fully anechoic chamber are equivalent to emissions measurements made on the same EUT on an OATS. Methods of demonstrating this equivalency are presented, along with actual measured data.

Roger McConnell has been with CKC Laboratories. Inc. in Mariposa, CA since 1986. His primary EMC activities have been in open field range calibration, anechoic room performance, and energy transfer in EMP. He has been a member of the Society of Automotive Engineers AE4R Subcommittee which has been advising the FAA in connection with the threat to aircraft from high energy rf fields. At CKC, he has engineering responsibility for the operation of the Mariposa Semi-Anechoic facility.

Prior to his employment at CKC, Mr. McConnell was employed for 24 years at the Stanford Linear Accelerator Center in technical support of high energy physics research. He specialized in the design of very high power cw rf systems, accelerator cavities and phase stable transmission lines. He has coauthored a number of papers relating to particle accelerator radio frequency systems which have appeared in the IEEE symposiums on Nuclear Science, and has authored six papers on open field range calibration and EMP which have appeared in the IEEE Symposiums on EMC. Mr. McConnell is a graduate in electrical engineering (1958) from the University of California at Berkeley, and holds the position of Senior Consultant at CKC Laboratories.

Clark Vitek is a member of the IEEE and AAMI, and has published articles on EMC at symposiums and in industry periodicals. His present position at CKC Laboratories is Consulting EMC Engineer / Pacific Northwest Regional Manager based at CKC's Hillsboro, Oregon facility. Mr. Vitek has overseen the development of two of CKC's Fully Anechoic Chambers: the 3.0m x 7.5m x 3.0m (w,l,h) chamber in Fremont, CA and the 6.0 x 8.0 x 3.0 (w,l,h) chamber in Hillsboro. He is a graduate in Electrical Engineering from the University of California, at Davis, with course work emphasis in RF and Microwave design.
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December '95 Meeting Notice

When/Where
Tuesday, December 12, 1995. Apple Computers, 4 Infinity Loop, Cupertino, CA. Dinner in the Piano Bar at 6:00 PM, technical presentation in the auditorium across the hall from the Piano Bar at 7:30 PM.
Topic/Speaker
Lightning and Transients Protection by Dr. Norman Violette.
Details
The SCV Electromagnetic Compatibility Chapter and the SCV/EMC Product Safety Technical Committee will hold a joint meeting on Tuesday, December 12, 1995, to hear a presentation by Dr. Norman Violette on "Lightning and Transients Protection".

The presentation will cover a wide range of lightning and transient related topics ranging from the Statue of Liberty Lightning Protection Project to circuit level protection devices. Dr. Violette will start the presentation with an overview of lighning basics, the physics of direct and indirect strikes, and how lightning can couple and interact with with power and signal lines. He will then progress to protection methods at the equipment level and cover such areas as design waveforms, and the advantages and disadvantages of various protection components and devices. Also included will be a general discussion of system level design considerations such as protection device coordination. At the conclusion of the presentation, he will describe the techniques used to provide lightning protection for the Statue of Liberty.

Dr. Norman Violette is one of the leading authorities on lightning and lightning protection in the United States. He received a BEE from Rensselear Polytechnic Institute, an MBA from Auburn University, and a PhD (EE) from North Carolina State University. He is a Registered Professional Engineer in the state of Virgina, and a member of the Board of Directors of the Lightning Protection Institute. He is a Distinguished Lecturer in the IEEE EMC Society.
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January '96 Meeting Notice

When/Where
Tuesday, January 9, 1995. Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
Topic/Speaker
A Clinical and Public Health Approach to Assess the Potential for Hand-held Wireless Communication Instruments to Interfere with Implanted Pacemakers by Dr. Don McRee of Wireless Technology Research, L.L.C. (WTR).
Details
With rapidly expanding use of wireless technologies, concen has been raised about potential electromagnetic interference with implantable devices. WTR, an independent research group concerned with potential health effects from wireless communication technology, is sponsoring a multi-center clinical study to assess the potential for hand-held wireless phone technologies to interfere with implanted pacemakers. The study is being conducted at the Mayo Clinic, the New England Medical Center, and the University of Oklahoma Health Sciences Center. The study will provide comprehensive, clinically relevant information on the prevalence of interference in approximately 1200 patients with implanted pacemakers set at their clinically appropriate settings wihile using a series of hand-held wireless telephone technologies. The presentation will focus on the origin of the concern, the research program put in place to address the question, and the clinical work being conducted.

Don McRee is the Director of Extramural Research for WTR, which is an independent research group established to assess the safety of wireless communication instruments. Before coming to WTR, he served as the Chief of both the Scientific Review Branch and the Environmental Health Resources Branch within the Division of Extramural Research at the National Institute of Environmental Health Sciences in Research Triangle Park. Dr. McRee has also been a professor at North Carolina State University. He has published over one hundred papers and abstracts in the area of bioelectromagnetic effects in the microwave frequency range, and has sat on numerous government and other committees in related fields. Dr. McRee earned a Ph.D. in Engineering Science from North Carolina State University and a M.A. in Physics from the College of William and Mary. He belongs to the American Association for the Advancement of Science, the Bioelectromagnetics Society, and the Health Physics Society. Dr. McRee has received the National Institute of Health´s Director´s Award and several Public Health Service Awards, and he has been listed in Who´s Who.
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February '96 Meeting Notice

When/Where
Tuesday, February 13, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
Topic/Speaker
System Level EMC Design by Ron Brewer of Instrument Specialties.
Details
Systems EMC problems have plagued the communications/electronics industry since the late 1800's. This is significant because these early problems preceded the invention of the triode vacuum tube. When the amplification of low level signals became possible the EMC problems became much worse because circuits could now respond to lower level interfering signals. Fortunately, there were few electronics devices to interfere! Today things are much different.

This presentation provides an introduction to systems EMC design. It provides a brief overview of the EMC problem and then covers printed circuit board considerations, differential and common mode trace and cable EMC hardening, and shielding for RF emission and susceptibility (immunity) control. The shielding design as emphasized in this presentation can be applied to existing systems without impacting circuit operation. It is the only suppression technique that can be used in this way. Topics that will be covered include examples of interference conditions, emitters and receptors, spectrum control, radiated emission and susceptibility, PCB layout and design considerations, Differential Mode/Common Mode trace and cable noise reduction, shielding effectiveness, containment/exclusion, aperture integrity, RF gasket types, and corrosion.

Ronald W. Brewer is Vice President, EMC Technical Services for Instrument Specialties Co., Inc. Ron is a NARTE Certified EMC Engineer with 25 years experience in EMC/TEMPEST design. He has written a number of technical articles on EMC design for systems/PCB and holds several patents. An internationally recognized EMC authority, he has made over 150 EMC technical presentations in 17 countries. Named Distinguished Lecturer by the IEEE EMC Society, Ron holds a BSE(engr. sci.) and a Ced(physics) form the University of Michigan, Ann Arbor.
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March '96 Meeting Notice

When/Where
Tuesday, March 12, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at Chillis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
Topic/Speaker
An Overview of the European Community Requirements for Harmonic Currents and Flicker (IEC 5555-2,3 IEC 1000-3-2,3, and EN60555-2,3) by John M. White, Behlman Electronics, Inc. and David Hightower, Valhalla Scientific.
Details
Electrical and Electronic apparatuses destined for the European Community are required to withstand a level of immunity so as not to be adversely affected by outside electromagnetic influences. They must also not cause undue interference with other devices. Specifically, IEC 555-2/1000-3-2 (EN60555-2) and IEC 555-3/1000-3-3 (EN60555-3) prescibe specific testing methods, limits and required equipment necessary to ensure products comply with acceptable levels of power line harmonics and flicker. This presentation will explore the technical requirements of these standards and provide an outline of essential test and measurement equipment.

John M. White is the Western Regional Sales Manager for Behlman Electronics, Inc. Since joining Behlman in 1985, he has also held postions ranging from Applications Engineer through Advanced Planning and New Product Development. He is author of numerous technical articles on topics of product testing and International Standards Evaluation. Mr. White received his MBA from California Lutheran University, and his BS in Avation Technology and Management form Western Michigan University.

David Hightower has 23 years of experience in the electronics field. He has been with Valhalla Scientific for the past 14 years, and is currently an Applications Engineer.
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April '96 Meeting Notice

When/Where
Tuesday, April 9, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
Topic/Speaker
"Conducted Immunity EMC Testing" by Joe Fischer, Fischer Custom Communications, Inc.
Details
European Ecomonic Community Immunity requirements such as those referenced in IEC Standard 1000-4-6 relate to the conducted immunity requirements of electrical and electronic equipment to electromagnetic distubances coming from intended radio-frequency (RF) transmitters in the frequency range 9 KHz up to 80 MHz. These transmitters generate electromagnetic fields that can induce RF voltages and currents on cables connected to electrical and electronic equipment. These cables include power mains, communications lines, interface cables, and control lines. These induced voltages and currents can then propagate into the equipment, causing the equipment to malfunction.

Typically, the conducted immunity test method subjects the equipment under test to a source of disturbance that simulates those coming from intentional RF transmitters. Using this test method, coupling and decoupling networks are used to apply the disturbing signal to one cable at a time, while keeping all other cables non-excited. The characteristics of the coupling and decoupling networks are defined in the test specification.

Joe Fischer will present the rationale, test requirements, and RF magnitudes that are injected into the equipment. In addition, test methodolgies and test equipment characteristics will also be discussed as well as factors that affect the RF power amplifier requirements. Joe Fischer has been involved in EMC and EM sensor design for the last 45 years. He is a past president of the IEEE EMC Society, and has served as a distinguished lecturer. He is the founder of Fischer Custom Communications, Inc, and still actively involved in development activities.
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May '96 Meeting Notice

When/Where
Tuesday, May 14, 1996. Cocktails (5:00 pm) and dinner (5:30 pm) at Chilis, 20060 Stevens Creek Blvd (between DeAnza Blvd and Blainey), Cupertino. Technical meeting at Apple Computers, 4 Infinity Loop, Cupertino, CA at 7:30 pm.
Topic/Speaker
"An Overview of Numerical Modeling Techniques for EMC" by Dr. Todd Hubing, University of Missouri-Rolla.
Details
Purchasing electromagnetic modeling software is somewhat like buying a used car, except most people who buy a car already know how to drive. Numerical EM modeling software can be a powerful asset in the hands of an experienced EMC engineer who is well-versed in the use of (and limitations of) a particular software package. But numerical modeling software won't tell the user what to model or how to model it. Despite the claims of many vendors, numerical modeling software is not easy to use and it can't really help you to isolate the source of an EMC problem unless you already have a pretty good idea of what that source is.

Can EM modeling software help product engineers to meet EMC requirements? Yes, it can! However, before investing hundreds or thousands of dollars in software, take the time to evaluate your company's needs and expectations. Who will be using the software, the circuit designer, the EMC engineer, or an EM modeling specialist? What kind of information or answers do you expect to get from the software? Do you need software that is analytical, numerical, or expert system based? Which numerical method is best suited to your needs, the method of moments, the finite element method, FDTD, or something else? What about design rule checkers, EMC modeling environments, or automated EMI prediction algorithms? Are they any good?

Prof. Todd Hubing of the University of Missouri-Rolla has been using commercial and non-commercial EM modeling software to model EMC problems for many years. He is familiar with nearly every EM modeling code marketed to the EMC community. At the May IEEE EMC Society Chapter meeting, he will review the various types of EM modeling software available commercially and over the internet. The purpose of this review is to help product developers and EMC engineers decide whether they can benefit from EM modeling software and which software packages are appropriate for their particular application. He will also discuss EMC modeling strategies (with and without a computer) as they apply to real products under development or to existing products with EMC problems.

Todd Hubing is an Associate Professor at the University of Missouri-Rolla and one of the principal faculty in the UMR Electromagnetic Compatibility Laboratory. He holds a BSEE degree from the Massachusetts Institute of Technology, an MSEE degree from Purdue University, and a Ph.D. in Electrical Engineering from North Carolina State University. Prior to joining the faculty at the University of Missouri-Rolla in 1989, Todd spent seven years in the "real world" as an EMC engineer at IBM in Research Triangle Park, North Carolina. Todd is a senior member of the IEEE and is on the EMC Society's Board of Directors. He has authored or presented more than 60 technical papers, presentations, and reports on electromagnetic modeling and other EMC-related subjects. He also writes the Chapter Chatter column for the EMC Society Newsletter.
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