Spectral Lines April 2005 Edition (click to view)
Date: Tuesday April 12th, 2005
Time: Social 5:30 p.m. Presentation 7:00 p.m.
Place: Applied Materials Bowers Cafeteria
3090 Bowers Ave., Santa Clara, CA 95051-0804
Subject: "Part I: EMI Analysis of complex systems, Part II Electrostatic Discharge - It failed! How to find the root cause!"
Speaker:Dr. David Pommerenke
Part I: EMI Analysis of complex systems
Many methods and tools exist for the analysis of EMI of complex systems. Examples are different probing methods, time domain data analysis,
frequency domain data analysis at different bandwidths and the methods that fall between time and frequency domain, such as zero span
spectrum analysis and Joint-Time-Frequency Analysis techniques such as Short Term FFT and wavelet analysis.
This talk will show the application of different data analysis techniques for complex systems. Special emphasis is given on explaining
the methods and on showing when which method provides the better inside, not on promoting one or the other method.
Part II: Electrostatic Discharge - It failed! How to find the root cause!
Assume a system has failed an ESD test. Of course, one could improve shielding but isn't it
better to exactly understand which electrical net or IC had been affected and, consequently,
just apply a small change to the board or software?
The talk explains methods on how to find the root cause of ESD failures by systematic local
injection and how to probe signals with GHz bandwidth, while applying ESD to the system.
It will show examples systems that experienced ESD failures that have been located using this
technique. Further, it will discuss how IC-level EMC will influence ESD design.
Speaker Bio:
David Pommerenke is associated professor at the EMC laboratory at UMR. Dr.
Pommerenke's speciality is the combination of electronics and electromagnetics.
Such problems can be found in intentional or unintentional disturbances of circuits,
Signal Integrity of fast networks and other situations in which the circuit behavior is dominated by "everything that is not on the
circuit diagram". His interests are: EMC, ESD, Electronics, Signal Integrity, measurement years.
He is member of the ESD standard setting group within IEC TC77b.
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