SANTA CLARA VALLEY CHAPTER OF THE IEEE EMC SOCIETY |
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2003 Monthly Chapter Meeting Notices |
� | January 13th, 2004 | "Time Domain Reflectometry for EMI Analysis and Troubleshooting" |
� | February 10th, 2004 | "Signal Detection with EMI receivers" |
� | March 9th, 2004 | "China Product Conformity Assessment - the Issues Foreign Companies are facing in China Market" |
� | April 13th, 2004 | "EMC Testing of Substation Products" |
� | May 11th, 2004 | "EMI Considerations in Selection of Ethernet Magnetics" |
� | June 10th, 2004 | |
� | July 8th, 2004 | |
� | August 11th, 2004 | |
� | September 14th, 2004 | |
� | October 12th, 2004 | |
� | November 9th, 2004 | |
� | December 14th, 2004 |
Directions and Dinner Information | ||
APPLIED MATERIALS, 3090 Bowers Avenue, Santa Clara, CA. Bowers Cafe. [MAP] | ||
Archive | ||
2003 Monthly Chapter Meeting Notices | ||
2002 Monthly Chapter Meeting Notices | ||
Fall 2001 Monthly Chapter Meeting Notices | ||
2000/2001 Monthly Chapter Meeting Notices | ||
1999/2000 Monthly Chapter Meeting Notices | ||
1998/1999 Monthly Chapter Meeting Notices | ||
1997/1998 Monthly Chapter Meeting Notices | ||
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1995/1996 Monthly Chapter Meeting Notices | ||
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January 2004 Meeting Notice | ||
When/Where: |
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Tuesday, January 13th, 2004. | ||
Topic/Speaker: | ||
"Time Domain Reflectometry for EMI Analysis and Troubleshooting" - Orin Laney, Kaiser Electronics, Inc. | ||
Details: |
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Signal integrity problems are often the root of
EMI problems. Time domain reflectometry is a powerful way to view
transmission systems in order to spot and diagnose signal integrity issues.
The talk will start with TDR theory, then use a live TDR demonstration to
illustrate various principles. Examples will include coax, waveguide,
microstrip, LAN cable, and perhaps an antenna or two. As time permits,
cables and adapters will be accepted from the audience and tested in
real-time, preferably ones that you suspect have problems. Remarks
concerning the care and handling of microwave rate bit streams and similar
challenges will conclude the talk. |
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February 2004 Meeting Notice | ||
When/Where: |
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Tuesday, February 10th, 2004. | ||
Topic/Speaker: | ||
"Signal Detection with EMI receivers" - Werner Schaefer, Cisco Systems, Inc. | ||
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Mr. Schaefer will discuss how the sweep time settings for a scanning receiver or the dwell time for a stepping receiver will affect the probability of intercept of broadband and narrow-band signals. An interpretation of the expected test results on the receiver display is also provided, together with an explanation of the limitations of test equipment. The impact of frequency versus receiver display resolution on signal detection is explained as well as the available receiver display detection modes and their appropriate use and limitations. In addition, the different receiver IF detectors, per CISPR 16-1-1, are presented and their hardware implementation, purpose and correct use are explained. Some EMI receiver specifications, as contained in CISPR 16-1-1 are discussed at the end of the presentation. This will also include a discussion of specifications like dynamic range and IF bandwidth specifications which are not called out in the standard.
About the Presenter: |
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March 2004 Meeting Notice | ||
When/Where: |
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Tuesday, March 9th, 2004. | ||
Topic/Speaker: | ||
"China Product Conformity
Assessment - the Issues Foreign Companies are facing in China
Market" - Leslie Bai, SIEMIC,Inc. |
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Details: |
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This presentation will start from the
introduction of the China Product Assessment System, the history, present
certification systems and predictable evolvement. The introduction
will cover four major China Certification Systems (CCC, NAL, RTA, and MPS)
currently administered under different government agencies. The
presentation will address the issues foreign companies are facing in the
China market. At time permits, three recently hot topics will be
covered as well, a) China GB Standards for WLAN and its implementation of
WLAN product certification; b) China's government position and current
status of SAR (Specific Energy Absorption Rate) from "October Guilin
Conference"; c) the new Chinese GB Standards Working Group on RFID. |
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April 2004 Meeting Notice | ||
When/Where: |
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Tuesday, April 13th, 2004. | ||
Topic/Speaker: | ||
"EMC Testing of Substation Products " - Jerry Ramie of ARC Technical Resources, Inc. | ||
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The Presentation, "EMC Testing of Substation
Products," concerns the EMC testing requirements for products that are
installed in Power Generation or Substation plants here in the US or in
Europe. The EMC Standards for Substations are discussed and their
similarities are pointed out. The relationship between EMC and resistance to
Sabotage is explored, with examples and recommendations for Power Providers.
A fuller view of the testing requirements for Protective Relays is
presented, and a run-down of the required tests for them is given.. The future growth potential of utility products is very bright and these tests will be run more often than in the past. Many manufacturers will need to become acquainted with these Standards to access this growing market. Their products will be evaluated using these types of tests and the reliability of the finished Utility installation will be affected by how well their products perform on these tests.
About the Presenter: |
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May 2004 Meeting Notice | ||
When/Where: |
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Tuesday, May 11th, 2004. | ||
Topic/Speaker: | ||
"EMI Considerations in Selection of Ethernet Magnetics" - Neven Pischl of Broadcom Corporation | ||
Details: |
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Ethernet devices use magnetics between the transceiver and Ethernet cable. Magnetics include center-tapped transformers, autotransformers, and common-mode chokes. Newer Ethernet devices use magnetics to provide 48V power. Integrated connectors, with built-in magnetics, are gaining popularity. The characteristics of these components are critical for EMI suppression. It is completely impossible to judge the EMI characteristics from information currently available in the magnetics data sheets. Magnetics EMI properties can be measured with a network analyzer on a 50 ohm test jig, but it should be kept in mind that the system-level performance may differ. Magnetics cannot be completely characterized without knowing the system characteristics. Also, test results depend on the test methods that are not yet standardized.The presentation explains the main factors that define EMI properties of Ethernet magnetics, in commonly used configurations. A bench-level test method for magnetics characterization is described, and a demonstration will be given. The focus will be on Ethernet magnetics, but the concepts apply generally to WAN and LAN magnetics. About the Presenter: Neven Pischl has 19 years of EMC and related experience in R&D, Aerospace, Consumer Electronics, and ITE, covering many areas of EMC compliance and high-speed design. He holds an MSEE degree, specialized in microwave measurements, NARTE EMC-Engineer certification, and two US patents related to differential signaling. Currently his main focus is design for high immunity, low noise and low emission ITE containing high-speed digital and sensitive analog circuitry. He is a Principal Engineer at Broadcom Corporation in San Jose, CA. |
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September 2004 Meeting Notice | ||
When/Where: |
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Tuesday, September 14th, 2004. | ||
Topic/Speaker: | ||
"Our Annual Social and Business Planning Session" | ||
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TBA | ||
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October 2004 Meeting Notice | ||
When/Where: |
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Tuesday, October 12th, 2004. | ||
Topic/Speaker: | ||
"TBA" | ||
Details: |
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About the Presenter: |
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November 2004 Meeting Notice | ||
When/Where: |
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Tuesday, November 9th, 2004. | ||
Topic/Speaker: | ||
"TBA" | ||
Details: |
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About the Presenter: |
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December 2004 Meeting Notice | ||
When/Where: |
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Tuesday, December 14th, 2004. | ||
Topic/Speaker: | ||
"TBA" | ||
Details: |
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About the Presenter: |
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Meeting Location: Applied Materials Bowers Cafe, 3090 Bowers Avenue, Santa
Clara, CA |
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