1996 Meetings

The linked titles of some meetings are the presentations speakers provided.

December 10, 1996: "Physics and Testing of ESD" by David Pommerenke, HP

Abstract: David Pommerenke will discuss two important aspects of ESD testing. The first addresses the issue of why air discharge seem to be so unrepeatable, and will cover the dominant variables that contribute to this aspect of ESD including charge and voltage, arc initiation, arc resistance, object impedance, currents, transient fields, and lower rise time limit.

Knowing the physical parameters which determine the severeness of ESD the second part of the talk will compare ESD testing with real ESD guided by the following key questions: Is the standard rise time realistic? What are unintended radiations? How similar are different brand simulators?

Bio: David Pommerenke was born April 11, 1962 in Ann Arbor. He received his diploma in Electrical Engineering in 1989 from the Technical University Berlin. He worked at the same university from 1990 until 1996 as research and teaching assistant in EMC and High Voltage. In 1995 he received his Ph.D. on "Transient Fields of ESD". Since August 1996 he's been employed as an EMC Engineer for the HP Roseville site responsible for the test an implementation of new EMC methods. Over the past several years he has published 20 papers on system level ESD, the breakdown process, numerical calculation of ESD, high voltage partial discharge detection systems and on project oriented teaching.

November 12, 1996: "EMC Measurement Uncertainty" by Edwin L. Bronaugh, EdB - EMC Consultants

Abstract: This month's presentation will review the material Mr. Bronaugh presented at the 1996 IEEE Symposium on EMC at Santa Clara in August. The talk will also include material from the Uncertainty Workshop to be held in Los Angles on November 11. The talk will start off with a review of the paper presented in August and then will go deeper into the subject of uncertainty in EMC measurements. Mr. Bronaugh plans to expand on each topic which was brought up in the Symposium paper. He expects to have lots of interaction with the audience in the form of questions, audience opinions, discussion, and answers.

Bio: Mr. Edwin L. (Ed) Bronaugh is a Fellow of the IEEE and an Honorary Life Member of the EMC Society. He has often served on the EMC Society Board of Directors, and is a past president of the Society. He is also a distinguished lecturer on EMC topics. He is a member of the EMC Standards Committee and represents IEEE on ANSI-Accredited Standards Committee C63; of which he is Vice Chairman. He has received a number of awards from the IEEE Society, including the Lawrence G. Cumming Award and the Richard R. Stoddart Award. He is co-author of a book on EMI measurements and over 100 papers. He is a NARTE-Certified EMC Engineer. He is a member of the SAE EMI and EMR Standards Committees, and the Aerospace EMC Committee AE4; and Alpha Phi Omega. He is listed in Who's Who in America, Who's Who in the World, Who's Who in Science and Engineering, and Men of Achievement. Mr. Bronaugh is Principal of EdB EMC Consultants, and independent EMC consulting firm. Previously, he was Vice President for Engineering at the Electro-Mechanics Company, Technical Director of Electro-Metrics, and Manager of EMC Research at Southwest Research Institute

October 8, 1996: "Demonstration and Measurement of the Effects of a Transient Suppression Plane on ESD" by Douglas C. Smith, Auspex Systems

Abstract: The effects on high frequency current flowing in a conductor of a transient suppression plane can be dramatic. This talk will cover some of the basics of making high frequency measurements with matched current probes and then apply the concepts to the measurement of the effects of a transient suppression plane on an ESD generated current. The results of the demonstration are dramatic and point to practical uses of transient suppression planes and the care that must be taken when making measurements of ESD effects.

Bio: Mr. Smith graduated from Vanderbilt University with a BSEE degree in 1969 and received and MSEE degree from the California Institute of Technology in 1970. He then joined Bell Telephone Laboratories as a Member of Technical Staff. Currently, he is Manager of EMC Development and Test at Auspex Systems. Mr. Smith has been granted fourteen patents, including one in system level ESD mitigation and three on high frequency measurement apparatus. Mr. Smith has lectured at Vanderbilt University, AT&T Bell Labs, and many public and private seminars on topics including high frequency noise measurement techniques, system level ESD, and Pulsed electromagnetic interference. He was a Distinguished Member of Technical Staff at AT&T Bell Labs, is a senior member of the IEEE, and author of the book "High Frequency Measurements and Noise in Electronic Circuits", published by Van Nostrand Reinhold, Inc.

September 10, 1996: "Annual Social and Planning Session"

Abstract: The Santa Clara Valley Electromagnetic Compatibility Society invites all EMC society members and prospective members to attend the annual social and planning session on Tuesday, September 10 from 5:00 to 8:00 p.m. The meeting will be held at the Building 4 Piano Bar at the Apple headquarters in Cupertino.

Refreshments and hors d'oeuvres will be served, and live entertainment will be provided by Mr. Brian Yoshida. Brian is an award winning pianist, guitarist, who is a two time Grammy Award nominee and a BAMMIE winner, and will play selections from classical, easy listening, rock, blues, show tunes. He will also take requests.

The Chapter has invited Thor Benzing, a recent graduate of Live Oak High School, to come to the social and demonstrate some of his science fair projects based on a Tesla Coil. His first project involved using the coil to determine effects of RF on different types of materials. The next project was to use the Tesla coil in conjunction with a radio to improve the measurement results. His most recent project was to build an enclosure around the coil such that it passed FCC Class B limits. Thor was awarded first place at the Santa Clara County Science Fair, plus received a $50.00 award from IEEE Safety Technical Committee, as well as an Honorable Mention Award from the US Army. Thor will be describing the steps he used at the Tandem Laboratory to design an appropriate containment around the RF generated from the Tesla Coil.

The chapter also invites prospective speakers to attend this session and submit presentation outlines for consideration. Suggested topics include: measurements (techniques, technology, problems, corrections, calibration); test facilities (shielded rooms, open field test sites, screen rooms, anechoic and semi-anechoic chambers); EM noise sources and studies; design for reduced noise; electrostatic discharge; antennas and propagation; EMC standards and regulations; and computer aided analysis and design. Anyone interested in presenting an outline of these or other appropriate topics should contact any of the Chapter ADCOM members.

May 14, 1996: "An Overview of Numerical Modeling Techniques for EMC" by Dr. Todd Hubing, University of Missouri-Rolla

Abstract: Purchasing electromagnetic modeling software is somewhat like buying a used car, except most people who buy a car already know how to drive. Numerical EM modeling software can be a powerful asset in the hands of an experienced EMC engineer who is well-versed in the use of (and limitations of) a particular software package. But numerical modeling software won't tell the user what to model or how to model it. Despite the claims of many vendors, numerical modeling software is not easy to use and it can't really help you to isolate the source of an EMC problem unless you already have a pretty good idea of what that source is.

Can EM modeling software help product engineers to meet EMC requirements? Yes, it can! However, before investing hundreds or thousands of dollars in software, take the time to evaluate your company's needs and expectations. Who will be using the software, the circuit designer, the EMC engineer, or an EM modeling specialist? What kind of information or answers do you expect to get from the software? Do you need software that is analytical, numerical, or expert system based? Which numerical method is best suited to your needs, the method of moments, the finite element method, FDTD, or something else? What about design rule checkers, EMC modeling environments, or automated EMI prediction algorithms? Are they any good?

Prof. Todd Hubing of the University of Missouri-Rolla has been using commercial and non-commercial EM modeling software to model EMC problems for many years. He is familiar with nearly every EM modeling code marketed to the EMC community. At the May IEEE EMC Society Chapter meeting, he will review the various types of EM modeling software available commercially and over the internet. The purpose of this review is to help product developers and EMC engineers decide whether they can benefit from EM modeling software and which software packages are appropriate for their particular application. He will also discuss EMC modeling strategies (with and without a computer) as they apply to real products under development or to existing products with EMC problems.

Bio: Todd Hubing is an Associate Professor at the University of Missouri-Rolla and one of the principal faculty in the UMR Electromagnetic Compatibility Laboratory. He holds a BSEE degree from the Massachusetts Institute of Technology, an MSEE degree from Purdue University, and a Ph.D. in Electrical Engineering from North Carolina State University. Prior to joining the faculty at the University of Missouri-Rolla in 1989, Todd spent seven years in the "real world" as an EMC engineer at IBM in Research Triangle Park, North Carolina. Todd is a senior member of the IEEE and is on the EMC Society's Board of Directors. He has authored or presented more than 60 technical papers, presentations, and reports on electromagnetic modeling and other EMC-related subjects. He also writes the Chapter Chatter column for the EMC Society Newsletter.

April 9, 1996: "Conducted Immunity EMC Testing" by Joe Fischer, Fischer Custom Communications, Inc.

Abstract: European Ecomonic Community Immunity requirements such as those referenced in IEC Standard 1000-4-6 relate to the conducted immunity requirements of electrical and electronic equipment to electromagnetic distubances coming from intended radio-frequency (RF) transmitters in the frequency range 9 KHz up to 80 MHz. These transmitters generate electromagnetic fields that can induce RF voltages and currents on cables connected to electrical and electronic equipment. These cables include power mains, communications lines, interface cables, and control lines. These induced voltages and currents can then propagate into the equipment, causing the equipment to malfunction.

Typically, the conducted immunity test method subjects the equipment under test to a source of disturbance that simulates those coming from intentional RF transmitters. Using this test method, coupling and decoupling networks are used to apply the disturbing signal to one cable at a time, while keeping all other cables non-excited. The characteristics of the coupling and decoupling networks are defined in the test specification.

Joe Fischer will present the rationale, test requirements, and RF magnitudes that are injected into the equipment. In addition, test methodolgies and test equipment characteristics will also be discussed as well as factors that affect the RF power amplifier requirements.

Bio: Joe Fischer has been involved in EMC and EM sensor design for the last 45 years. He is a past president of the IEEE EMC Society, and has served as a distinguished lecturer. He is the founder of Fischer Custom Communications, Inc, and still actively involved in development activities.

March 12, 1996: "An Overview of the European Community Requirements for Harmonic Currents and Flicker (IEC 5555-2,3 IEC 1000-3-2,3, and EN60555-2,3)" by John M. White, Behlman Electronics, Inc. and David Hightower, Valhalla Scientific

Abstract: Electrical and Electronic apparatuses destined for the European Community are required to withstand a level of immunity so as not to be adversely affected by outside electromagnetic influences. They must also not cause undue interference with other devices. Specifically, IEC 555-2/1000-3-2 (EN60555-2) and IEC 555-3/1000-3-3 (EN60555-3) prescibe specific testing methods, limits and required equipment necessary to ensure products comply with acceptable levels of power line harmonics and flicker. This presentation will explore the technical requirements of these standards and provide an outline of essential test and measurement equipment.

Bio: John M. White is the Western Regional Sales Manager for Behlman Electronics, Inc. Since joining Behlman in 1985, he has also held postions ranging from Applications Engineer through Advanced Planning and New Product Development. He is author of numerous technical articles on topics of product testing and International Standards Evaluation. Mr. White received his MBA from California Lutheran University, and his BS in Avation Technology and Management form Western Michigan University.

David Hightower has 23 years of experience in the electronics field. He has been with Valhalla Scientific for the past 14 years, and is currently an Applications Engineer.

February 13, 1996: "System Level EMC Design" by Ron Brewer of Instrument Specialties

Abstract: Systems EMC problems have plagued the communications/electronics industry since the late 1800's. This is significant because these early problems preceded the invention of the triode vacuum tube. When the amplification of low level signals became possible the EMC problems became much worse because circuits could now respond to lower level interfering signals. Fortunately, there were few electronics devices to interfere! Today things are much different.

This presentation provides an introduction to systems EMC design. It provides a brief overview of the EMC problem and then covers printed circuit board considerations, differential and common mode trace and cable EMC hardening, and shielding for RF emission and susceptibility (immunity) control. The shielding design as emphasized in this presentation can be applied to existing systems without impacting circuit operation. It is the only suppression technique that can be used in this way. Topics that will be covered include examples of interference conditions, emitters and receptors, spectrum control, radiated emission and susceptibility, PCB layout and design considerations, Differential Mode/Common Mode trace and cable noise reduction, shielding effectiveness, containment/exclusion, aperture integrity, RF gasket types, and corrosion.

Bio: Ronald W. Brewer is Vice President, EMC Technical Services for Instrument Specialties, Inc. Ron is a NARTE Certified EMC Engineer with 25 years experience in EMC/TEMPEST design. He has written a number of technical articles on EMC design for systems/PCB and holds several patents. An internationally recognized EMC authority, he has made over 150 EMC technical presentations in 17 countries. Named Distinguished Lecturer by the IEEE EMC Society, Ron holds a BSE(engr. sci.) and a Ced(physics) from the University of Michigan, Ann Arbor.

January 9, 1995: "A Clinical and Public Health Approach to Assess the Potential for Hand-held Wireless Communication Instruments to Interfere with Implanted Pacemakers" by Dr. Don McRee of Wireless Technology Research, L.L.C. (WTR)

Abstract: With rapidly expanding use of wireless technologies, concen has been raised about potential electromagnetic interference with implantable devices. WTR, an independent research group concerned with potential health effects from wireless communication technology, is sponsoring a multi-center clinical study to assess the potential for hand-held wireless phone technologies to interfere with implanted pacemakers. The study is being conducted at the Mayo Clinic, the New England Medical Center, and the University of Oklahoma Health Sciences Center. The study will provide comprehensive, clinically relevant information on the prevalence of interference in approximately 1200 patients with implanted pacemakers set at their clinically appropriate settings wihile using a series of hand-held wireless telephone technologies. The presentation will focus on the origin of the concern, the research program put in place to address the question, and the clinical work being conducted.

Bio: Don McRee is the Director of Extramural Research for WTR, which is an independent research group established to assess the safety of wireless communication instruments. Before coming to WTR, he served as the Chief of both the Scientific Review Branch and the Environmental Health Resources Branch within the Division of Extramural Research at the National Institute of Environmental Health Sciences in Research Triangle Park. Dr. McRee has also been a professor at North Carolina State University. He has published over one hundred papers and abstracts in the area of bioelectromagnetic effects in the microwave frequency range, and has sat on numerous government and other committees in related fields. Dr. McRee earned a Ph.D. in Engineering Science from North Carolina State University and a M.A. in Physics from the College of William and Mary. He belongs to the American Association for the Advancement of Science, the Bioelectromagnetics Society, and the Health Physics Society. Dr. McRee has received the National Institute of Health's Director's Award and several Public Health Service Awards, and he has been listed in Who's Who.